Each ElProScan system employs a versatile multi-channel data acquisition system, not only used for implementing the state-of-the-art SECM/SICM/SECCM/SKP techniques, but also uniquely designed to support a wide range of synchronized microcopy and spectroscopy measurements known as “hyphenated techniques”.
A brief list of well-supported external devices in synchronized control by HEKA hardware/software:
- RDE/RRDE systems
- pH meters
- FTIR spectrometers
- UV-Vis-NIR light sources and spectrophotometers
- Photomultiplier tube (PMT)
- Filter Exchanger and LED wavelength switcher
- Temperature controllers
- Perfusion systems
- Research grade CMOS/EMCCD super-resolution cameras
- Pressure Controllers and Flow Pumps
ElProscan (ELP-3) system offers the most flexible optical designs by virtue of HEKA’s inverted microscope. The uniquely configured ELP-3 optical train features modular designs to synchronize tip-scanning with various optical microscopy and micro-spectroscopy techniques. Please contact us for designing your specific optics and integration plan to meet your synchronized e-SPM application requirements.
Examples of HEKA’s state-of-the-art hyphenated scanning probe microscopy techniques
- Tip-Enhanced Raman Spectroscopy (SECM-TERS)
- Surface-Enhanced Raman Spectroscopy (SECM-SERS)
- Electrochemiluminescence (SECM-Micro ECL)
- Fourier-Transform Infrared Spectroscopy (SECM-FTIR)
- Attenuated Total Reflection Spectroscopy (SECM-ATR)
- Dark Field Scattering Microscopy (SECM-DFSM)
- Fluorescence Lifetime Imaging (SPECM-FLI)