Each ElProScan system employs a versatile multi-channel data acquisition system, not only used for implementing the state-of-the-art SECM/SICM/SECCM/SKP techniques, but also uniquely designed to support a wide range of synchronized microcopy and spectroscopy measurements known as “hyphenated techniques”.     

A brief list of well-supported external devices in synchronized control by HEKA hardware/software:

  • RDE/RRDE systems
  • pH meters
  • FTIR spectrometers
  • UV-Vis-NIR light sources and spectrophotometers
  • Photomultiplier tube (PMT)
  • Filter Exchanger and LED wavelength switcher
  • Temperature controllers
  • Perfusion systems
  • Research grade CMOS/EMCCD super-resolution cameras
  • Pressure Controllers and Flow Pumps

ElProscan (ELP-3) system offers the most flexible optical designs by virtue of HEKA’s inverted microscope. The uniquely configured ELP-3 optical train features modular designs to synchronize tip-scanning with various optical microscopy and micro-spectroscopy techniques.  Please contact us for designing your specific optics and integration plan to meet your synchronized e-SPM application requirements.

Examples of HEKA’s state-of-the-art hyphenated scanning probe microscopy techniques

  • Tip-Enhanced Raman Spectroscopy (SECM-TERS)
  • Surface-Enhanced Raman Spectroscopy (SECM-SERS)
  • Electrochemiluminescence (SECM-Micro ECL)
  • Fourier-Transform Infrared Spectroscopy (SECM-FTIR)
  • Attenuated Total Reflection Spectroscopy (SECM-ATR)
  • Dark Field Scattering Microscopy (SECM-DFSM)
  • Fluorescence Lifetime Imaging (SPECM-FLI)