Each ElProScan system employs a versatile multi-channel data acquisition system, not only used for implementing the state-of-the-art SECM/SICM/SECCM/SKP techniques, but also uniquely designed to support a wide range of synchronized microcopy and spectroscopy measurements known as “hyphenated techniques”.
A brief list of well-supported external devices in synchronized control by HEKA hardware/software:
ElProscan (ELP-3) system offers the most flexible optical designs by virtue of HEKA’s inverted microscope. The uniquely configured ELP-3 optical train features modular designs to synchronize tip-scanning with various optical microscopy and micro-spectroscopy techniques. Please contact us for designing your specific optics and integration plan to meet your synchronized e-SPM application requirements.
Examples of HEKA’s state-of-the-art hyphenated scanning probe microscopy techniques
Necessary cookies are absolutely essential for the website to function properly. This category only includes cookies that ensures basic functionalities and security features of the website. These cookies do not store any personal information.
Any cookies that may not be particularly necessary for the website to function and is used specifically to collect user personal data via analytics, ads, other embedded contents are termed as non-necessary cookies. It is mandatory to procure user consent prior to running these cookies on your website.